NAPSON CORPORATION EC-80 Wafer Low Resistivity Similure ADE 6035 Silicon Wafers

Semiconductor materials Solar-cell materials (Silicon Polysilicon SiC etc)
New materials functional materials (Carbon nanotube DLC graphene Ag nanowire etc)
Conductive thin film (Metal ITO etc)
Silicon-related epitaxial materials Ion-implantation sample
Chemical compound semiconductor (GaAs Epi GaN Epi InP Ga etc)

Sample sizes
~8 inch ~156x156mm

Measuring range
[R] 1m ~ 200 O·cm

[RS] 10m ~ 3000 O/sq

* The range is separated from each Low Middle High and S-High probe type.

*Please refer the measurement range for each probe type as below;
(1) Low : 0.01~0.5O/? (0.001~0.05O-cm)
(2) Middle : 0.5~10O/? (0.05~0.5O-cm)
(3) High : 10~1000O/? (0.5~60O-cm)
(4) S-High : 1000~3000O/? (60~200O-cm)